Marshall Technical Reports Server

Degradation of the Adhesive Properties of MD–944 Diode Tape
by Simulated Low Earth Orbit Environmental Factors

NASA/TM-2006–214712, Albyn, K. and Finckenor, M., Degradation of the Adhesive Properties of MD–944 Diode Tape
by Simulated Low Earth Orbit Environmental Factors,
George C. Marshall Space Flight Center Marshall Space Flight Center, AL 35812, National Aeronautics and Space Administration Washington, DC 20546–0001, December 2006, pp. 60, Format(s): PDF 16867k


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The International Space Station (ISS) solar arrays utilize MD–944 diode tape with silicone pressure-sensitive adhesive to protect the underlying diodes and also provide a high-emittance surface. Onorbit, the silicone adhesive will be exposed and ultimately convert to a glass-like silicate due to atomic oxygen (AO). The current operational plan is to retract ISS solar array P6 and leave it stored under load for a long duration (6 mo or more). The exposed silicone adhesive must not cause the solar array to stick to itself or cause the solar array to fail during redeployment. The Environmental Effects Branch at Marshall Space Flight Center, under direction from the ISS Program Office Environments Team, performed simulated space environment exposures with 5-eV AO, near ultraviolet radiation and ionizing radiation. The exposed diode tape samples were put under preload and then the resulting blocking force was measured using a tensile test machine. Test results indicate that high-energy AO, ultraviolet radiation, and electron ionizing radiation exposure all reduce the blocking force for a silicone-to-silicone bond. AO exposure produces the most significant reduction in blocking force.
Keywords:solar array, atomic oxygen, ultraviolet radiation, ionizing radiation, electron, silicone, adhesive, space environment, low earth orbit
Subjects:Chemistry and Materials: Non-Metallic Materials: Adhesives
ID Code:740
Deposited On:22 May 2007